The new HiLumi Model MQXFS5 out of the New Vertical Cryostat at the SM18

Highlights & expertise

These are some of the research and development lines we follow in the section. A list of recent publications can be found here.

Quench development investigation

The initial development of quenches in Nb3Sn magnets is an active area of study in the section. Combining measurements with simulations we can obtain insight of the performance of the strands in the superconducting cable.

See more:

  • R. Keijzer, “Advanced Diagnostics of Rutherford Cable Performance in Accelerator Magnets: Current redistribution & Quench development”, Doctoral Dissertation, University of Twente, 2025, doi.org/10.3990/1.9789036569040.
  • R. Keijzer, G. Willering, M. Dhalle, H. ten Kate, “Effect of Strand Damage in Nb3Sn Rutherford Cables on the Quench Propagation in Accelerator Magnets,” IEEE Trans. Appl. Supercond., vol. 33, no. 5, pp. 1–5, 2023, doi:10.1109/TASC.2023.3244140.
  • R. Keijzer, G. Succi, G. Willering, B. Bordini, et al., “Modelling V-I Measurements of Nb3Sn Accelerator Magnets With Conductor Degradation,” IEEE Trans. Appl. Supercond., vol. 32, no. 6, pp. 4001105, 2022, doi:10.1109/TASC.2022.3153247.

Cryogenic electronics

Identifying the origin of a quench and understanding how it propagates along a coil are essential steps in the design of superconducting magnets and their protection systems. Achieving these objectives requires advanced instrumentation techniques, often involving numerous cables—sometimes extending tens of meters—to transmit weak, millivolt-level signals from sensors to the acquisition system. This setup can degrade the signal-to-noise ratio and complicate quench analysis.

A promising approach to address these challenges is the use of external sensors capable of precise quench localization, combined with relocating the signal conditioning and acquisition electronics inside the cryostat—closer to the sensors themselves. This configuration can significantly enhance measurement accuracy and reliability.

Our team is currently working on the standardization of tests for commercial off-the-shelf electronic components under various cryogenic conditions (77 K, 4.5 K, and 1.9 K). The goal is to build a comprehensive library of cryogenically tested components and to develop a complete acquisition chain—from the sensor to digital data processing.

For more information see: